Material data base

We are very excited to announce the new material database feature in app.speqqle!

In app.speqqle the optical response of a material is described by a physical model containing a set of parameters specific to each material. Models are usually set up by fitting optical data measured for example in reflection, transmission or ellipsometry experiments. In case of the analysis of a multilayer sample composed of different materials, each material needs to be measured and modelled separately before starting the analysis of the multilayer stack. The new material database in app.speqqle provides you with pre-built material models for your analysis. Database models are based on published literature data and allow you a much faster entry to your analysis without having to set up each model by yourself. For example, if you want to determine the thickness of a silicon oxide layer on a silicon substrate from ellipsometry or reflectivity data, you can choose the silicon, and the silicon oxide models from the database and directly fit your data.

You find the material database under the Experiment tab. Current materials include silicon, silicon dioxide, gold, silver, BK7 and BAF10. Some of the materials are only available for users with a Basic subscription.