app.speqqle - one platform for all your spectroscopy applications
You want to get specific information from your spectroscopic data? Browse our applications to see how app.speqqle can help you with that. If you don't find what you are looking for, please contact us!
Application notes
Ellipsometry
Analysis of ellipsometry data to determine the complex dielectric constant and refractive index of bulk tungsten carbide.
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app.speqqle example session files
Multilayer fitting
Analysis of ellipsometry, reflectivity and transmission spectra on multilayer samples. In the example we fitted a silicon + silicon oxide waferchip.
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Here we fitted the Stokes and Anti-Stokes sides of the Raman response to extract the real temperature at the laser spot. We started with the Speqqle Autofit and refined the fit in a subsequent step.
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Fitting Raman spectra
Fitting bulk samples like glass
This is an example of the extraction of the optical properties of bulk BK7 from the published refractive index. Here we used a Sellmeier equation with three terms.
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Here we fitted the reflectivity spectrum of a bulk Strontium Titanate substrate.
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